Original Research
Production of PbO thin film using Silar method and electronıc and interface properties of Pb/PbO/p-Si MIS contacts
E. Erdem
a
S. Asubay
b
O. Gulluc

aBatman University, School of Graduate Studies, Branch of Physics, Batman,

Turkey

bDicle University, Faculty of Sciences, Department of Physics, Diyarbakir, Turkey cBatman University, Faculty of Sciences and Arts, Department of Physics,

Batman, Turkey


Journal of Ovonic Research 2022, 18(1),44-56; https://doi.org/10.15251/JOR.2022.181.44
Submitted:Oct 12, 2021
Accepted:Jan 25, 2022
Published:Feb 01, 2022
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Cite This Article
E. Erdem ,S. Asubay ,O. Gulluc . (2022). Journal of Ovonic Research. Production of PbO thin film using Silar method and electronıc and interface properties of Pb/PbO/p-Si MIS contacts, 18(1), ,44-56. https://doi.org/10.15251/JOR.2022.181.44
Abstract

In this paper, using SILAR thin film technique, which is low cost and is easy to control, the lead oxide (PbO) thin film was grown onto both microscope glass and inorganic semiconductor silicon (Si) wafer after appropriate chemical cleaning processes. The coating stage was performed by keeping the solution at 80 ℃. After forming a PbO thin film on the silicon semiconductor, Pb metal was evaporated onto its upper surface.

Optical, morphological and structural properties of the PbO thin film formed on glass were investigated. The electrical and interface characteristics of the Pb/PbO/p-Si MIS Schottky diode were investigated in the dark by using current-voltage (I-V), capacity-voltage (C-V) and conductance-voltage (G-V) in 10kHz-2MHz frequency range and capacity-frequency (C-f) characteristics in 1kHz- 10MHz frequency range.

©2026 by the authors. Submitted for possible open access publication under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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