Department of Physics, College of Science, University of Diyala, Iraq
Journal of Ovonic Research 2025, 21(5),667-673; https://doi.org/10.67229/JOR16585
Thin films of manganese oxide and copper oxide were deposited on glass substrates (2.5x2.5)cm² using chemical spray pyrolysis at 400°C. Film thicknesses varied from 150 to
550 nm with a constant 0.1 mol concentration. XRD analysis demonstrated polycrystalline films with a monoclinic structure. XRD intensity increased with thickness, and peaks shifted slightly to higher angles. FE-SEM images of the thinnest and thickest films indicate quasi- spherical nanostructures. EDX confirmed the presence of all expected elements. Optical characterization using UV-visible spectroscopy identify a decrease in transmittance and band gap with increasing thickness. Conversely, reflectance, refractive index, extinction coefficient, and real and imaginary dielectric constants increased with thickness.

